Effect of Fresnel diffraction in X-ray micrography
نویسندگان
چکیده
منابع مشابه
Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens
We investigated the diffractive focusing properties of ~111! GaAs linear Bragg–Fresnel lenses ~BFLs! developed for hard x-ray microscopy and microdiffraction of complex materials in confined geometries. We demonstrated that the use of GaAs yields significant processing advantages due to the reduced zone depth. Focal plane diffraction patterns of linear BFLs measured at the advanced photon sourc...
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Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and app...
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متن کاملX-ray diffraction.
where the peak shapes were described by a pseudo-Voigt function and the background was modeled with an 6-term polynomial. Additionally, the PXRD patterns obtained at room temperature and 100 K were analyzed by Le Bail refinement using the GSAS and EXPGUI software, 2,3 where the peak shapes were described by a pseudo-Voigt function (CW profile function 3) and the background was modeled with an 4...
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ژورنال
عنوان ژورنال: Seibutsu Butsuri
سال: 2000
ISSN: 0582-4052,1347-4219
DOI: 10.2142/biophys.40.s153_2